A contactless method for measuring the recombination velocity of an individual grain boundary in thin-film photovoltaics (2010)
Attributed to:
New Materials for High Energy Colour X-ray Imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.3486482
Publication URI: http://dx.doi.org/10.1063/1.3486482
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 9