An adaptive non-raster scanning method in atomic force microscopy for simple sample shapes (2015)
Attributed to:
Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0957-0233/26/3/035401
Publication URI: http://dx.doi.org/10.1088/0957-0233/26/3/035401
Type: Journal Article/Review
Parent Publication: Measurement Science and Technology
Issue: 3