Accurate measurement of the piezoelectric coefficient of thin films by eliminating the substrate bending effect using spatial scanning laser vibrometry (2010)

First Author: Leighton G

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0964-1726/19/6/065011

Publication URI: http://dx.doi.org/10.1088/0964-1726/19/6/065011

Type: Journal Article/Review

Parent Publication: Smart Materials and Structures

Issue: 6