Optical imaging beyond the diffraction limit by SNEM: effects of AFM tip modifications with thiol monolayers on imaging quality. (2015)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2014.12.001
PubMed Identifier: 25544678
Publication URI: http://europepmc.org/abstract/MED/25544678
Type: Journal Article/Review
Volume: 150
Parent Publication: Ultramicroscopy
ISSN: 0304-3991