Medium-energy ion-scattering study of strained holmium silicide nanoislands grown on silicon (100) (2008)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevb.78.035423

Publication URI: http://dx.doi.org/10.1103/physrevb.78.035423

Type: Journal Article/Review

Parent Publication: Physical Review B

Issue: 3