Novel Correlated Energy-Loss and Cathodoluminescence Spectroscopy in the Transmission Electron Microscope
Lead Research Organisation:
University of Sheffield
Department Name: Electronic and Electrical Engineering
Abstract
Many modern semiconductor devices are based on multiple layer structures or the lateral structuring of planar layers to locate charge carriers in specific positions. These so-called quantum domain structures can have unique (opto)electronic properties, depending on the design used for carrier confinement (quantum wells, quantum wires or quantum dots for confinement in two, one or zero dimensions of space, respectively). Various forms of spectroscopy can be used to investigate such materials, however, most lack the spatial resolution necessary to study individual nanostructures. Spectroscopy in a transmission electron microscope (TEM) has the unique advantage of being able to investigate such individual nanostructures embedded below the specimen surface at nanometre-scale spatial resolution in two dimensions. This project proposes to combine the rather new method of electron spectroscopic profiling (ELSP), a hybrid imaging-spectroscopy method based on electron energy-loss spectroscopy (EELS) in a transmission electron microscope equipped with imaging energy filter, and cathodoluminescence (CL) spectroscopy. While EELS provides chemical and electronic information, CL yields optical information. Hence, the combination of both methods in the same instrument provides a unique probe of the local optoelectronic properties of light-emitting quantum domain structures. It is intended to investigate in particular quantum well and quantum dot structures of compound semiconductors with spatial dimensions of only a few nanometres in one or three dimensions, respectively, which are only really accessible using a modern analytical TEM. In order to incorporate CL detection into the narrow high-resolution pole-piece of a high-quality field-emission (scanning) TEM an existing specimen holder will be modified in order to accommodate both a newly designed highly-efficient light collecting optical cavity and a fibre optic cable. The fibre optics will allow the user to connect the specimen holder to two external spectrometers, a small Czerny-Turner type spectrometer with silicon diode array detector for the ultraviolet-visible (UV-VIS) wavelength range important for wide-bandgap nitride semiconductors or a high-resolution optical grating diffractometer installed in another laboratory with cooled germanium detector for the infrared (IR) range, relevant for the study of arsenide based semiconductors.
Organisations
People |
ORCID iD |
Thomas Walther (Principal Investigator) |
Publications
Amari H
(2011)
Accurate calibration for the quantification of the Al content in AlGaN epitaxial layers by energy-dispersive X-ray spectroscopy in a Transmission Electron Microscope
in Journal of Physics: Conference Series
Amari H
(2012)
Measurement of the Al content in AlGaN epitaxial layers by combined energy-dispersive X-ray and electron energy-loss spectroscopy in a transmission electron microscope
in physica status solidi c
Amari H
(2011)
Nanoscale EELS analysis of elemental distribution and band-gap properties in AlGaN epitaxial layers
in Journal of Physics: Conference Series
Amari H
(2012)
Characterization of thickness, elemental distribution and band-gap properties in AlGaN/GaN quantum wells by aberration-corrected TEM/STEM
in Journal of Physics: Conference Series
Amari H
(2012)
Characterization of InGaN/GaN epitaxial layers by aberration corrected TEM/STEM
in physica status solidi c
Lari L
(2010)
GaN, AlGaN, HfO 2 based radial heterostructure nanowires
in Journal of Physics: Conference Series
Lari L
(2013)
GaN-based radial heterostructure nanowires grown by MBE and ALD
in Journal of Physics: Conference Series
Lari L
(2010)
Electron microscopy of AlGaN-based multilayers for UV laser devices
in Journal of Physics: Conference Series
Lari L
(2011)
Direct observation by transmission electron microscopy of the influence of Ni catalyst-seeds on the growth of GaN-AlGaN axial heterostructure nanowires
in Journal of Crystal Growth
Description | developed a new type of specimen holder for simultaneous CL and EELS imaging in a TEM |
Exploitation Route | several companies have now developed commercial specimen holders on similar principles |
Sectors | Electronics,Energy |
Description | The work, together with a patent application, an NDA and a proof-of-concept award led to an idea for commercialisation, however, the university did not want to pursue the patent application beyond the point of filing a PCT; subsequently two different comapnies commercialised similar developments (and one cited our published patent). |
First Year Of Impact | 2009 |
Sector | Electronics,Manufacturing, including Industrial Biotechology |
Impact Types | Economic |
Description | University of Sheffield |
Amount | £9,100 (GBP) |
Funding ID | Proof of concept fund |
Organisation | University of Sheffield |
Sector | Academic/University |
Country | United Kingdom |
Start | 11/2008 |
End | 04/2009 |
Title | COLLECTION OF ELECTROMAGNETIC RADIATION EMITTED FROM PARTICLE-IRRADIATED SAMPLES |
Description | Apparatus for collecting electromagnetic radiation emitted from a sample irradiated with charged particles is disclosed. The apparatus comprises: a solid body of material at least substantially transparent to electromagnetic radiation having wavelengths in at least one range, the body having an external surface and being adapted to locate or enable location of a sample with respect to the body such that at least a portion of the electromagnetic radiation emitted from the sample when irradiated with charged particles enters the body and is incident on the external surface from within the body; reflecting means arranged to reflect, from the external surface and back into the body, at least emitted radiation having wavelengths within said one range incident upon the external surface from within the body; and conduit means arranged to collect electromagnetic radiation emitted into the body from a sample and reflected back into the body from the external surface, and convey the collected electromagnetic radiation away from the body. Corresponding sample holders, measurement systems, and measurement methods are also disclosed. |
IP Reference | WO2011030156 |
Protection | Patent granted |
Year Protection Granted | 2011 |
Licensed | No |
Impact | none - not further pursued by university |