The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS
Lead Research Organisation:
CARDIFF UNIVERSITY
Department Name: School of Physics and Astronomy
Abstract
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Organisations
Publications
Bagheri M
(2016)
Threshold Voltage Compensation Error in Voltage Programmed AMOLED Displays
in Journal of Display Technology
Dhara S
(2019)
Photoconductive laser spectroscopy as a method to enhance defect spectral signatures in amorphous oxide semiconductor thin-film transistors
in Applied Physics Letters
Dhara S
(2021)
Tail state mediated conduction in zinc tin oxide thinfilm phototransistors under below bandgap optical excitation.
in Scientific reports
Han S
(2016)
Effects of post-deposition vacuum annealing on film characteristics of p-type Cu2O and its impact on thin film transistor characteristics
in Applied Physics Letters
Janicek P
(2017)
Spectroscopic ellipsometry characterization of ZnO:Sn thin films with various Sn composition deposited by remote-plasma reactive sputtering
in Applied Surface Science
Lee S
(2016)
Subthreshold Schottky-barrier thin-film transistors with ultralow power and high intrinsic gain.
in Science (New York, N.Y.)
| Description | We have demonstrated a powerful laser photoconductive spectroscopic technique for the characterisation of sub-bandgap defects in active AOS TFT devices. The technique allows identification of sub-bandgap defects through their spectral signature (wavelength/energy). The enhancement in photon flux over a spectrally filtered broadband source results in an increased dynamic range, allowing below band-gap absorption coefficients to be measured in a range that covers six orders of magnitude. The sensitivity of the technique can be further improved by tuning the applied bias gate voltage. Our technique has the further advantage that changes in defect density can be monitored during TFT device fabrication, which might help researchers optimise the overall process. |
| Exploitation Route | Our findings allow researchers to optimise the fabrication of AOS devices. They allow researchers to understand how the defects evolve over time during device operation. |
| Sectors | Aerospace, Defence and Marine,Digital/Communication/Information Technologies (including Software),Electronics,Energy |
| Description | Please see the impact description provided for EP/M013650/1 |
| Sector | Aerospace, Defence and Marine,Digital/Communication/Information Technologies (including Software),Electronics |
| Description | Knowledge Transfer Partnership |
| Amount | £101,539 (GBP) |
| Funding ID | KTP010131 |
| Organisation | Innovate UK |
| Sector | Public |
| Country | United Kingdom |
| Start | 04/2016 |
| End | 04/2018 |