Localization of iron in rice grain using synchrotron X-ray fluorescence microscopy and high resolution secondary ion mass spectrometry (2014)
Attributed to:
Analysis at the nanoscale:addressing key problems in plant sciences with advanced analytical techniques
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.jcs.2013.12.006
Publication URI: http://dx.doi.org/10.1016/j.jcs.2013.12.006
Type: Journal Article/Review
Parent Publication: Journal of Cereal Science
Issue: 2