High-Fidelity Preparation, Gates, Memory, and Readout of a Trapped-Ion Quantum Bit. (2014)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1103/physrevlett.113.220501

PubMed Identifier: 25494060

Publication URI: http://europepmc.org/abstract/MED/25494060

Type: Journal Article/Review

Volume: 113

Parent Publication: Physical review letters

Issue: 22

ISSN: 0031-9007