BTI and leakage aware dynamic voltage scaling for reliable low power cache memories (2015)

First Author: Rossi D
Attributed to:  Resilient and Testable Energy-Efficient Digital Hardware funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/iolts.2015.7229858

Publication URI: http://dx.doi.org/10.1109/iolts.2015.7229858

Type: Conference/Paper/Proceeding/Abstract