Absolute metrology by phase and frequency modulation for multiwavelength interferometry. (2011)
Attributed to:
Optimum Multi-Wavelength Interferometric Sensing: Absolute Metrology from Nanometres to 100m
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/ol.36.002928
PubMed Identifier: 21808361
Publication URI: http://europepmc.org/abstract/MED/21808361
Type: Journal Article/Review
Volume: 36
Parent Publication: Optics letters
Issue: 15
ISSN: 0146-9592