Film thickness measurement and contamination layer correction for quantitative XPS (2016)
Attributed to:
Next Generation Biomaterials Discovery
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.5934
Publication URI: http://dx.doi.org/10.1002/sia.5934
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 3
ISSN: 10969918