Lifetime Enhancement of 4H-SiC PiN Diodes Using High Temperature Oxidation Treatment (2018)
Attributed to:
Vehicle Electrical Systems Integration (VESI)
funded by
UKRI
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.4028/www.scientific.net/msf.924.440
Publication URI: http://dx.doi.org/10.4028/www.scientific.net/msf.924.440
Type: Journal Article/Review
Parent Publication: Materials Science Forum
ISSN: 02555476