Low-temperature investigations of ion-induced amorphisation in silicon carbide nanowhiskers under helium irradiation (2020)

First Author: Aradi E

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2019.143969

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2019.143969

Type: Journal Article/Review

Parent Publication: Applied Surface Science