Multiple scattering in scanning helium microscopy (2020)
Attributed to:
Microscopy with neutral helium atoms: A wide-ranging new technique for delicate samples
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.5143950
Publication URI: http://dx.doi.org/10.1063/1.5143950
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 6