Carrier-Free Dual-Comb Distance Metrology Using Two-Photon Detection (2021)
Attributed to:
Frequency-comb enabled metrology for manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/cleo/europe-eqec52157.2021.9541761
Publication URI: http://dx.doi.org/10.1109/cleo/europe-eqec52157.2021.9541761
Type: Conference/Paper/Proceeding/Abstract