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Reliable material characterization at low x-ray energy through the phase-attenuation duality (2022)

First Author: Buchanan I

Attributed to: Nikon-UCL Prosperity Partnership on Next-Generation X-Ray Imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0085506

Publication URI: http://dx.doi.org/10.1063/5.0085506

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 12