Reliable material characterization at low x-ray energy through the phase-attenuation duality (2022)
Attributed to:
Nikon-UCL Prosperity Partnership on Next-Generation X-Ray Imaging
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0085506
Publication URI: http://dx.doi.org/10.1063/5.0085506
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 12