Carrier-free dual-comb distance metrology using two-photon detection

First Author: Wright H.
Attributed to:  Frequency-comb enabled metrology for manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85120006199

Type: Conference Proceeding

Parent Publication: Optics InfoBase Conference Papers