Applications of the Oxford-JEOL aberration-corrected electron microscope (2010)

First Author: Nellist P
Attributed to:  Platform Grant Support for Materials Characterisation at Oxford funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1080/14786435.2010.516775

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/77958559607

Type: Journal Article/Review

Parent Publication: Philosophical Magazine

Issue: 35-36