Simulations and Measurements of Failure Modes in SiC Cascode JFETs under Short Circuit Conditions (2021)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/compel52922.2021.9646031
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85124225533
Type: Conference/Paper/Proceeding/Abstract