Comparison of Short Circuit Failure Modes in SiC Planar MOSFETs, SiC Trench MOSFETs and SiC Cascode JFETs (2021)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/wipda49284.2021.9645092
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85124013465
Type: Conference/Paper/Proceeding/Abstract