Performance of SiC cascode JFETs under single and repetitive avalanche pulses (2020)
Attributed to:
Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2020.113644
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85085255708
Type: Journal Article/Review
Parent Publication: Microelectronics Reliability