New mountain ridge modes in a film/substrate bilayer (2023)
Attributed to:
A rational reduced model for elastic layers and its application in pattern formation analysis
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1177/10812865231208414
Publication URI: http://dx.doi.org/10.1177/10812865231208414
Type: Journal Article/Review
Parent Publication: Mathematics and Mechanics of Solids