Carrier-free dual-comb distance metrology using two-photon detection (2021)
Attributed to:
Frequency-comb enabled metrology for manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85166462595
Type: Other
Parent Publication: Optics InfoBase Conference Papers
ISSN: 21622701