A high-precision silicon-on-insulator position sensor (2023)
Attributed to:
Disorder enhanced on-chip spectrometers.
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0133968
Publication URI: http://dx.doi.org/10.1063/5.0133968
Type: Journal Article/Review
Parent Publication: APL Photonics
Issue: 4