A study of defect evolution in multi-energy helium implanted monocrystalline and polycrystalline silicon (2009)

First Author: Abrams K

Attributed to: In-Situ TEM Studies of Ion-Irradiated Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/pssc.200881452

Publication URI: http://dx.doi.org/10.1002/pssc.200881452

Type: Journal Article/Review

Parent Publication: physica status solidi c

Issue: 8

ISSN: 18626351