Non-invasive Thermal Resistance Measurement for GaN Wafer Process Control and Optimization (2018)
Attributed to:
Integrated GaN-Diamond Microwave Electronics: From Materials, Transistors to MMICs
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/itherm.2018.8419633
Publication URI: http://dx.doi.org/10.1109/itherm.2018.8419633
Type: Conference/Paper/Proceeding/Abstract