A Unified Computational Scheme for 3D Statistical Simulation of Reliability Degradation of Nanoscale MOSFETs (2012)

First Author: Adamu-Lema F.
Attributed to:  Molecular-Metal-Oxide-nanoelectronicS (M-MOS): Achieving the Molecular Limit funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Other

Parent Publication: International Conference on Simulation of Semiconductor Processes and Devices, SISPAD