Oxygen-vacancy-mediated dielectric property in perovskite Eu0.5Ba0.5TiO3-d epitaxial thin films (2018)

First Author: Li W

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.41495

Publication URI: https://www.repository.cam.ac.uk/handle/1810/294396

Type: Journal Article/Review