Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices (2018)

First Author: Vynck K
Attributed to:  Silicon Photonics for Future Systems funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1802.06600

Publication URI: https://arxiv.org/abs/1802.06600

Type: Other