Dislocation-induced structural and luminescence degradation in InAs quantum dot emitters on silicon (2023)
Attributed to:
Time-resolved cathodoluminescence scanning electron microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2301.03671
Publication URI: https://arxiv.org/abs/2301.03671
Type: Other