A Stein Goodness of fit Test for Exponential Random Graph Models (2021)

First Author: Xu W
Attributed to:  Application driven Topological Data Analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2103.00580

Publication URI: https://arxiv.org/abs/2103.00580

Type: Other