The origin of negative charging in amorphous Al$_2$O$_3$ films: The role of native defects (2018)
Attributed to:
Structural dynamics of amorphous functional oxides - the role of morphology and electrical stress
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1811.00610
Publication URI: https://arxiv.org/abs/1811.00610
Type: Other