Experimental verification of electrostatic boundary conditions in gate-patterned quantum devices (2018)

First Author: Hou H
Attributed to:  Nanoelectronic Based Quantum Physics- Technology and Applications. funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.30893

Publication URI: https://www.repository.cam.ac.uk/handle/1810/283530

Type: Journal Article/Review