Defects in complex oxide thin films for electronics and energy applications: Challenges and opportunities (2020)

First Author: Li W
Attributed to:  Equipment Account: Integrated Thin Film Deposition and Analysis System funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.55382

Publication URI: https://www.repository.cam.ac.uk/handle/1810/308291

Type: Journal Article/Review