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Methods and Applications for Nanometrology using Scanning Precession Electron Diffraction (2022)

First Author: Crout P

Attributed to: Electron Diffraction Based Nano-Metrology funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.93907

Publication URI: https://www.repository.cam.ac.uk/handle/1810/346488

Type: Thesis