Evaluation of Floating Zone and Epitaxial Planar Silicon Detectors With Different Substrate Thickness After Irradiation up to $2\times 10^{16}$ ${\rm n}_{\rm eq}$ cm$^{- 2}$ (2009)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tns.2009.2034315

Publication URI: http://dx.doi.org/10.1109/tns.2009.2034315

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nuclear Science

Issue: 6

ISSN: 0018-9499