Development of a Fast, Single-pass, Micron-resolution Beam Position Monitor Signal Processor: Beam Test Results from ATF2 (2010)

First Author: Burrows, Philip And Apsimon, Robert And Bett, Douglas And Christian, Glenn And Constance, Ben And Others
Attributed to:  John Adams Institute supplement 2011/12 funded by STFC

Abstract

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Bibliographic Information

Volume: C100523

Parent Publication: Conf.Proc.