Developments of the off-plane x-ray grating spectrometer for IXO (2010)
Attributed to:
Radiation Damage Studies in CCDs and CMOS Imagers, X-ray CCDs for the XEUS Wide Field Imager and CMOS Sensor Development
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/12.857460
Publication URI: http://dx.doi.org/10.1117/12.857460
Type: Conference/Paper/Proceeding/Abstract