Nano-scratch, nanoindentation and fretting tests of 5-80nm ta-C films on Si(100) (2013)

First Author: Beake B
Attributed to:  Access to Multi-functional nano-scale analysis system funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.wear.2013.01.073

Publication URI: http://dx.doi.org/10.1016/j.wear.2013.01.073

Type: Journal Article/Review

Parent Publication: Wear

Issue: 1-2