Phase measurement through sinusoidal excitation with application to multi-wavelength interferometry (2009)
Attributed to:
Optimum Multi-Wavelength Interferometric Sensing: Absolute Metrology from Nanometres to 100m
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1464-4258/11/5/054008
Publication URI: http://dx.doi.org/10.1088/1464-4258/11/5/054008
Type: Journal Article/Review
Parent Publication: Journal of Optics A: Pure and Applied Optics
Issue: 5