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Tilt scanning interferometry: a 3D k-space representation for depth-resolved structure and displacement measurement in scattering materials (2010)

First Author: Galizzi G

Attributed to: *Depth-resolved phase-contrast optical metrology in life sciences and engineering funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.870257

Publication URI: http://dx.doi.org/10.1117/12.870257

Type: Conference/Paper/Proceeding/Abstract