Tilt scanning interferometry: a 3D k-space representation for depth-resolved structure and displacement measurement in scattering materials (2010)
Attributed to:
*Depth-resolved phase-contrast optical metrology in life sciences and engineering
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/12.870257
Publication URI: http://dx.doi.org/10.1117/12.870257
Type: Conference/Paper/Proceeding/Abstract