Thermal Stability of Thin Compressively Strained Ge Surface Channels Grown on Relaxed Si 0.2 Ge 0.8 Reverse-Graded Buffers (2012)

First Author: Dobbie A

Attributed to: Renaissance Germanium funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1149/2.063205jes

Publication URI: http://dx.doi.org/10.1149/2.063205jes

Type: Journal Article/Review

Parent Publication: Journal of The Electrochemical Society

Issue: 5