Uneven fringe projection for efficient calibration in high-resolution 3D shape metrology. (2007)
Attributed to:
Optimum Multi-Wavelength Interferometric Sensing: Absolute Metrology from Nanometres to 100m
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/ao.46.006113
PubMed Identifier: 17712375
Publication URI: http://europepmc.org/abstract/MED/17712375
Type: Journal Article/Review
Volume: 46
Parent Publication: Applied optics
Issue: 24
ISSN: 1559-128X