Tilt scanning interferometry: a numerical simulation benchmark for 3D metrology. (2009)
Attributed to:
*Depth-resolved phase-contrast optical metrology in life sciences and engineering
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/ao.48.003184
PubMed Identifier: 19516362
Publication URI: http://europepmc.org/abstract/MED/19516362
Type: Journal Article/Review
Volume: 48
Parent Publication: Applied optics
Issue: 17
ISSN: 1559-128X