Light Element Analysis Facility - LEAF

Electron Microscopy tends to focus upon analysis of the heavier elements; however the lighter elements often have a critical role to pay. Furthermore, in soft matter and organic materials, it is ofteny only light elements that are present. With the advent of new technologies, it has become possible to analyse for light elements with much greater precision. We are requesting support for a new light element analysis facility to be housed in our interdisciplinary Electron Microscopy Centre complementing the existing equipment (2 TEM's, a FIB and 2 SEM's). We propose to build upon our existing Electron Microscopy facilities by adding an electron probe microanalyser (EPMA), a separate Soft X-ray Emission Spectrometer (SXES) system and a confocal Raman microscope. This will allow us to probe from elemental Li up to O and beyond, giving detailed compositional, electronic and spatial analysis to support research in a range of critical topics.

The current and demands of energy storage and 21st century technology fundamentally hinge on material science technology, materials for energy and our ability to source and extract the raw materials needed for modern technology. Over the past 30 years, research has shown, beyond a doubt, that the presence of trace elements dissolved in stoichiometric solids can have a profound effect on the physical properties of materials. The University of St Andrews has a world leading activity in materials science ranging from natural rocks through to high technology materials. Continued growth in these areas requires the ability to analyse and characterise natural and synthetic materials using a wide array of methods. Funding of LEAF will afford excellent opportunity to address a range of cutting edge science and technology. An illustration of this potential lies across the areas of lithium battery technology. EPMA and Raman microscopy allow intricate structures such as rocks or batteries to examined at great analytical precision. Complementing this with SXES on the nanoscale provides excellent spatial resolution, especially when aligned with FIB extraction of zones of interest. Such capability is of considerable relevance to battery failure analysis and to lithium extraction and processing. Similarly there is excellent cross relevance to research in critical elements.

Funding of LEAF will allow a number of strategically important research challenges to be addressed. Critical components are often to found in the light elements, for example secondary electrolyte interfaces in batteries that are carbonate based. Opportunities relate to lithium and sodium battery technology, organic LEDs, soft matter, fuel cells, organic solar materials, catalysis. We have strong engagement with companies such as Johnson Matthey, Rolls Royce, Morgan Materials, AGM, Oxis, JLR, JSW, all of whom have strong development programmes and are keen to work with us or indeed use these new facilities within LEAF and indeed the complimentary electron microscopy suite