Quantitative non-destructive nanoscale characterisation of advanced materials
Lead Research Organisation:
University of Bristol
Department Name: Physics
Abstract
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Organisations
People |
ORCID iD |
Martin Kuball (Principal Investigator) |
Publications
Barthel A
(2020)
Ti Alloyed a-Ga2O3: Route towards Wide Band Gap Engineering.
in Micromachines
Gucmann F
(2021)
Scanning thermal microscopy for accurate nanoscale device thermography
in Nano Today
Middleton C
(2019)
Thermal Transport in Superlattice Castellated Field Effect Transistors
in IEEE Electron Device Letters
Mishra A
(2020)
Characterization of trap states in buried nitrogen-implanted ß -Ga2O3
in Applied Physics Letters
Rackauskas B
(2019)
Reliability and lifetime estimations of GaN-on-GaN vertical pn diodes
in Microelectronics Reliability
Zhou Y
(2022)
Unusual Deformation and Fracture in Gallium Telluride Multilayers.
in The journal of physical chemistry letters
Description | Reliability results on GaN electronics were obtained illustrating the role of dislocaton |
Exploitation Route | Reliability qualification of GaN electronics |
Sectors | Aerospace Defence and Marine |
Description | A new technique for defect imaging was developed and first results were obtained. At present a correlaton between defects and device performance was established. |
First Year Of Impact | 2021 |
Sector | Aerospace, Defence and Marine |
Impact Types | Economic |