Improvements in quantification accuracy of inorganic time-of-flight secondary ion mass spectrometric analysis of silicate materials by using C60 primary ions. (2009)

First Author: Henkel T

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/rcm.4257

PubMed Identifier: 19780063

Publication URI: http://europepmc.org/abstract/MED/19780063

Type: Journal Article/Review

Volume: 23

Parent Publication: Rapid communications in mass spectrometry : RCM

Issue: 21

ISSN: 0951-4198