Test Beam Characterization of 3-D Silicon Pixel Detectors (2008)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tns.2008.2005630

Publication URI: http://dx.doi.org/10.1109/tns.2008.2005630

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nuclear Science

Issue: 6

ISSN: 0018-9499