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Time evolution of off-state degradation of AlGaN/GaN high electron mobility transistors (2014)

First Author: Bajo M

Attributed to: Novel Thermal Management of Power Electronic Devices: High Power High Frequency Planar Gunn Diodes funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4881637

Publication URI: http://dx.doi.org/10.1063/1.4881637

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 22